Rachel S. Goldman



2094 H.H. Dow Building

T: (734) 647-6821




Research Facilities


Michigan Center for Materials Characterization (MC)^2

Location: NCRC BLDG 22 - G010

The Michigan Center for Materials Characterization (MC)^2 is a user-facility that provides a broad spectrum of analytical and nano-mechanical testing equipment. Of particular interest for this program are the electron microscopes. A high-resolution transmission electron microscope (JEOL JEM-3011UHR) provides 0.14 nm lattice and 0.175 nm point-to-point resolution, and an analytical electron microscope (JEOL 2010F) provides 0.1 nm lattice and 0.25 nm point-to-point resolution. The JEOL 2010F is also equipped with x-ray dispersive spectroscopy and parallel electron energy-loss spectroscopy. FEI Nova 200 Nanolab dualbeam focussed ion beam workstation and scanning electron microscope integrates ion and electron beams for FIB and SEM functionality in one machine. Users can switch between the two beams for quick and accurate navigation and milling. Convergence of the SEM and FIB at short working distance allows precision “slice-and-view” cross-sectioning and analysis at high resolution. Also, an atomic force microscope (Veeco Dimension Icon Atomic Force Microscope), capable of contact and tapping mode AFM, STM, MFM, is available in (MC)^2. See website for more details: https://mc2.engin.umich.edu