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Xiaoqing  Pan


B.S. (Phys.): Nanjing University, China, 1982.
M.S. (Phys.): Nanjing University, China, 1985.
Ph.D. (Dr. rer. nat.) (Phys.): Universitaet des Saarlandes, Germany, 1991.

Research Interests:

Current research involves the structure/property relationships in both functional and structural ceramics. High Resolution Transmission Electron Microscopy (HRTEM), in combination with Analytical Electron Microscopy (AEM), are utilized to study the bulk ceramics and/or thin films of chemical sensors, ferroelectrics, and silicon nitride-based materials. Physical and chemical deposition techniques are used to prepare the films. Problems under investigation include interfacial structure and chemistry, grain growth, defects, segregation behavior, and electrical properties. Considerable emphasis is placed on understanding the atomistic structure and chemistry of ceramic/ceramic and metal/ceramic interfaces.

Awards and Service:

  • Outstanding Young Investigator Award, Chinese National Science Foundations, 2004.
  • Visiting Principal Scientist, Institute of Materials Research and Engineering, Singapore, 2003.
  • Visiting Principal Fellow, Institute of Materials Research and Engineering, and Visiting Professor, Department of Materials Science and Engineering, National University of Singapore, Singapore, Summer 2002.
  • Visiting Professor, Department of Physics, Nanjing University, 2000 and 2001.
  • NSF Faculty Early Career Development (CAREER) Award, 1998.
  • Traveling Exhibit Award of the Microscopy Society of America, 1997.
  • Best Poster at the Microscopy and Microanalysis Meeting, Cleveland, Ohio (1997).
  • Best Poster at the Microscopy and Microanalysis Meeting, Atlanta, Georgia (1998).
  • Best Poster at the 7th International Conference on Intergranular and Interphase Boundaries in Materials, Lisbon, Portugal (1995).
  • Max Planck Fellowship, 1992-1994.
  • New Star Award for the Distinguished Thesis, Nanjing University, Nanjing, China (1982).