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Materials Science and Engineering, University of Michigan

  MSE / People / Faculty / Steven Yalisove

Articles

  1. Cahill, DG; Yalisove, SM, "Ultrafast lasers in materials research," MRS Bulletin, Vol. 31, Issue 8, pp. 594 (2006). link
  2. Feng, Q; Picard, YN; McDonald, JP; van Rompay, PA; Yalisove, SM; Pollock, TM, "Femtosecond laser machining of single-crystal superalloys through thermal barrier coatings," Materials Science And Engineering A-Structural Materials Properties Microstructure And Processing, Vol. 430, Issue 1-2, pp. 203 (2006). link
  3. McDonald, JP; Mistry, VR; Ray, KE; Yalisove, SM, "Femtosecond pulsed laser direct write production of nano- and microfluidic channels," Applied Physics Letters, Vol. 88, Issue 18, (2006). link
  4. McDonald, JP; Mistry, VR; Ray, KE; Yalisove, SM; Nees, JA; Moody, NR, "Femtosecond-laser-induced delamination and blister formation in thermal oxide films on silicon (100)," Applied Physics Letters, Vol. 88, Issue 15, (2006). link
  5. Picard, YN; Adams, DP; Palmer, JA; Yalisove, SM, "Pulsed laser ignition of reactive multilayer films," Applied Physics Letters, Vol. 88, Issue 14, (2006). link
  6. Tull, BR; Carey, JE; Mazur, E; McDonald, JP; Yalisove, SM, "Silicon surface morphologies after femtosecond laser irradiation," MRS Bulletin, Vol. 31, Issue 8, pp. 626 (2006). link
  7. Zhao, ZB; Yalisove, SM; Bilello, JC, "Stress anisotropy and stress gradient in magnetron sputtered films with different deposition geometries," Journal of Vacuum Science & Technology A, Vol. 24, Issue 2, pp. 195 (2006). link
  8. Feng, Q; Picard, YN; Liu, H; Yalisove, SM; Mourou, G; Pollock, TM, "Femtosecond laser micromachining of a single-crystal superalloy," Scripta Materialia, Vol. 53, Issue 5, pp. 511 (2005). link
  9. McDonald, JP; McClelland, AA; Picard, YN; Yalisove, SM, "Role of a native oxide on femtosecond laser interaction with silicon (100) near the damage threshold," Applied Physics Letters, Vol. 86, Issue 26, (2005). link
  10. Zhao, ZB; Rek, ZU; Yalisove, SM; Bilello, JC, "Evolution of in-plane texture in reactively sputtered CrN films," Journal of Applied Physics, Vol. 97, Issue 2, (2005). link
  11. Zhao, ZB; Rek, ZU; Yalisove, SM; Bilello, JC, "Nanostructured chromium nitride films with a valley of residual stress," Thin Solid Films, Vol. 472, Issue 1-2, pp. 96 (2005). link
  12. Burnett, DJ; Gabelnick, AM; Marsh, AL; Lewis, HD; Yalisove, SM; Fischer, DA; Gland, JL, "Defect enhanced carbon monoxide oxidation at elevated oxygen pressures on a Pt/Al2O3 thin film," Journal of Physical Chemistry B, Vol. 108, Issue 17, pp. 5314 (2004). link
  13. Shyam, A; Picard, YN; Jones, JW; Allison, JE; Yalisove, SM, "Small fatigue crack propagation from micronotches in the cast aluminum alloy W319," Scripta Materialia, Vol. 50, Issue 8, pp. 1109 (2004). link
  14. Zhao, ZB; Rek, ZU; Yalisove, SM; Bilello, JC, "In situ x-ray diffraction observation of multiple texture turnovers in sputtered Cr films," Journal of Vacuum Science & Technology A, Vol. 22, Issue 6, pp. 2365 (2004). link
  15. Zhao, ZB; Rek, ZU; Yalisove, SM; Bilello, JC, "Phase formation and structure of magnetron sputtered chromium nitride films: in-situ and ex-situ studies," Surface & Coatings Technology, Vol. 185, Issue 1-3, pp. 329 (2004). link
  16. Whitacre, JF; Yalisove, SM; Bilello, JC, "Real-time/in situ diffraction study of phase and microstructural evolution in sputtered beta-Ta/Ta2O5 films (vol 19, 2910, 2001)," Journal of Vacuum Science & Technology A-Vacuum Surfaces And Films, Vol. 20, Issue 4, pp. 1505 (2002). link
  17. Zhao, ZB; Hershberger, J; Yalisove, SM; Bilello, JC, "Determination of residual stress in thin films: a comparative study of X-ray topography versus laser curvature method," Thin Solid Films, Vol. 415, Issue 1-2, pp. 21 (2002). link
  18. Zhao, ZB; Yalisove, SM; Rek, ZU; Bilello, JC, "Evolution of anisotropic microstructure and residual stress in sputtered Cr films," Journal of Applied Physics, Vol. 92, Issue 12, pp. 7183 (2002). link
  19. Whitacre, JF; Yalisove, SM; Bilello, JC, "Real-time/in situ diffraction study of phase and microstructural evolution in sputtered beta-Ta/Ta2O5 films," Journal of Vacuum Science & Technology A-Vacuum Surfaces And Films, Vol. 19, Issue 6, pp. 2910 (2001). link
  20. Kendig, LP; Rek, ZU; Yalisove, SM; Bilello, JC, "The role of impurities and microstructure on residual stress in nanoscale Mo films," Surface & Coatings Technology, Vol. 132, Issue 2-3, pp. 124 (2000). link
  21. Cammarata, RC; Bilello, JC; Greer, AL; Sieradzki, K; Yalisove, SM, "Stresses in multilayered thin films," MRS Bulletin, Vol. 24, Issue 2, pp. 34 (1999).
  22. Malhotra, AK; Whitacre, JF; Zhao, ZB; Hershberger, J; Yalisove, SM; Bilello, JC, "An in situ ex situ X-ray analysis system for thin sputtered films," Surface & Coatings Technology, Vol. 110, Issue 1-2, pp. 105 (1998).
  23. Whitacre, JF; Rek, ZU; Bilello, JC; Yalisove, SM, "Surface roughness and in-plane texturing in sputtered thin films," Journal of Applied Physics, Vol. 84, Issue 3, pp. 1346 (1998). link
  24. Karpenko, OP; Bilello, JC; Yalisove, SM, "Growth anisotropy and self-shadowing: a model for the development of in-plane texture during polycrystalline thin-film growth," Journal of Applied Physics, Vol. 82, Issue 3, pp. 1397 (1997). link
  25. Karpenko, OP; Yalisove, SM; Eaglesham, DJ, "Surface roughening during low temperature Si(100) epitaxy," Journal of Applied Physics, Vol. 82, Issue 3, pp. 1157 (1997). link
  26. Malhotra, SG; Rek, Z; Yalisove, SM; Bilello, JC, "Depth-sensitive strain analysis of a W-Ta-W trilayer," Thin Solid Films, Vol. 301, Issue 1-2, pp. 55 (1997). link
  27. Malhotra, SG; Rek, ZU; Yalisove, SM; Bilello, JC, "Strain gradients and normal stresses in textured Mo thin films," Journal of Vacuum Science & Technology A-Vacuum Surfaces And Films, Vol. 15, Issue 1-2, pp. 345 (1997). link
  28. Malhotra, SG; Rek, ZU; Yalisove, SM; Bilello, JC, "Analysis of thin film stress measurement techniques," Thin Solid Films, Vol. 301, Issue 1-2, pp. 45 (1997). link
  29. Hershberger, J; Ying, T; Kustas, F; Fehrenbacher, L; Yalisove, SM; Bilello, JC, "Residual stress, atomic structure, and growth morphology in B4C/SiC multilayer coatings," Surface & Coatings Technology, Vol. 87-8, Issue 1-3, pp. 237 (1996). link
  30. Karpenko, OP; Yalisove, SM, "CoSi2 heteroepitaxy on patterned Si(100) substrates," Journal of Applied Physics, Vol. 80, Issue 11, pp. 6211 (1996). link
  31. Malhotra, AK; Yalisove, SM; Bilello, JC, "Growth and characterization of Ta/W multiscalar multilayer composite films," Thin Solid Films, Vol. 286, Issue 1-2, pp. 196 (1996). link
  32. Malhotra, SG; Rek, ZU; Yalisove, SM; Bilello, JC, "Depth dependence of residual strains in polycrystalline Mo thin films using high-resolution x-ray diffraction," Journal of Applied Physics, Vol. 79, Issue 9, pp. 6872 (1996). link
  33. Adams, DP; Parfitt, LJ; Bilello, JC; Yalisove, SM; Rek, ZU, "Microstructure and Residual-Stress of Very Thin Mo Films," Thin Solid Films, Vol. 266, Issue 1, pp. 52 (1995). link
  34. Bilello, JC; Yalisove, SM; Rek, ZU, "The Evolution of Texture In Thin-Films and Multilayers Via Synchrotron Transmission Laue and Grazing-Incidence X-Ray-Scattering," Journal of Physics D-Applied Physics, Vol. 28, Issue 4A, pp. A295 (1995). link
  35. Olk, CH; Yalisove, SM; Doll, GL, "Defect-Induced Absorption-Band-Edge Values In Beta-Fesi2," Physical Review B, Vol. 52, Issue 3, pp. 1692 (1995).
  36. Olk, CH; Yalisove, SM; Heremans, JP; Doll, GL, "Negative Magnetoresistance As a Result of Hopping Conduction In Polycrystalline Thin-Films of Beta-FeSi2," Physical Review B, Vol. 52, Issue 7, pp. 4643 (1995). link
  37. Srolovitz, DJ; Yalisove, SM; Bilello, JC, "Design of Multiscalar Metallic Multilayer Composites For High-Strength, High Toughness, and Low Cte Mismatch," Metallurgical And Materials Transactions A-Physical Metallurgy And Materials Science, Vol. 26, Issue 7, pp. 1805 (1995).
  38. Vill, M; Adams, DP; Yalisove, SM; Bilello, JC, "Mechanical-Properties of Tough Multiscalar Microlaminates," Acta Metallurgica Et Materialia, Vol. 43, Issue 2, pp. 427 (1995).
  39. Vill, MA; Rek, ZU; Yalisove, SM; Bilello, JC, "Growth Textures of Thick Sputtered Films and Multilayers Assessed Via Synchrotron Transmission Laue," Journal of Applied Physics, Vol. 78, Issue 6, pp. 3812 (1995). link
  40. Adams, DP; Yalisove, SM, "Low-Temperature Homoepitaxial Growth on Nonplanar Si Substrates," Journal of Applied Physics, Vol. 76, Issue 9, pp. 5185 (1994). link
  41. Adams, DP; Yalisove, SM; Eaglesham, DJ, "Interfacial and Surface Energetics of Cosi2," Journal of Applied Physics, Vol. 76, Issue 9, pp. 5190 (1994). link
  42. Karpenko, OP; Olk, CH; Yalisove, SM; Mansfield, JF; Doll, GL, "Structural Investigation of Fe Silicide Films Grown By Pulsed-Laser Deposition," Journal of Applied Physics, Vol. 76, Issue 4, pp. 2202 (1994). link
  43. Karpenko, Op; Bilello, JC; Yalisove, SM, "Combined Transmission Electron-Microscopy and X-Ray Study of The Microstructure and Texture In Sputtered Mo Films," Journal of Applied Physics, Vol. 76, Issue 8, pp. 4610 (1994). link
  44. Olk, CH; Karpenko, Op; Yalisove, SM; Doll, Gl; Mansfield, JF, "Growth of Epitaxial Beta-Fesi2 Thin-Films By Pulsed-Laser Deposition on Silicon(111)," Journal of Materials Research, Vol. 9, Issue 11, pp. 2733 (1994).
  45. Adams, DP; Vill, M; Tao, J; Bilello, JC; Yalisove, SM, "Controlling Strength and Toughness of Multilayer Films - A New Multiscalar Approach," Journal of Applied Physics, Vol. 74, Issue 2, pp. 1015 (1993). link
  46. Adams, DP; Yalisove, SM; Eaglesham, DJ, "Effect of Hydrogen on Surface Roughening During Si Homoepitaxial Growth," Applied Physics Letters, Vol. 63, Issue 26, pp. 3571 (1993). link
  47. Eaglesham, Dj; Unterwald, Fc; Luftman, H; Adams, DP; Yalisove, SM, "Effect of H on Si Molecular-Beam Epitaxy," Journal of Applied Physics, Vol. 74, Issue 11, pp. 6615 (1993). link
  48. Loretto, D; Gibson, Jm; Yalisove, SM, "Reconstruction of Heterointerfaces In Mbe - Cosi2(001) on Si(001)," Thin Solid Films, Vol. 184, pp. 309 (1990). link
  49. Vandenberg, Jm; White, Ae; Hull, R; Short, Kt; Yalisove, SM, "Anisotropic Strain Relaxation In Buried Cosi2 Layers Formed By Mesotaxy," Journal of Applied Physics, Vol. 67, Issue 2, pp. 787 (1990). link
  50. Headrick, Rl; Konarski, P; Yalisove, SM; Graham, WR, "Medium-Energy Ion-Scattering Study of The Initial-Stage of Oxidation of Fe(001)," Physical Review B, Vol. 39, Issue 9, pp. 5713 (1989). link
  51. Loretto, D; Gibson, Jm; Yalisove, SM, "Evidence For a Dimer Reconstruction At a Metal-Silicon Interface," Physical Review Letters, Vol. 63, Issue 3, pp. 298 (1989). link
  52. Tung, Rt; Batstone, Jl; Yalisove, SM, "Si/CoSi2/Si Structures - Pseudomorphism, Interface Structures, Epitaxial Orientations, and The Control of Pinholes," Journal of The Electrochemical Society, Vol. 136, Issue 3, pp. 815 (1989). link
  53. Tung, Rt; Schrey, F; Yalisove, SM, "Homoepitaxial Growth of CoSi2 and NiSi2 on (100) and (110) Surfaces At Room-Temperature," Applied Physics Letters, Vol. 55, Issue 19, pp. 2005 (1989). link
  54. Yalisove, SM; Eaglesham, Dj; Tung, RT, "Single-Crystal Growth of CoSi2(110) on Si(110)," Applied Physics Letters, Vol. 55, Issue 20, pp. 2075 (1989). link
  55. Yalisove, SM; Tung, Rt; Loretto, D, "Epitaxial Orientation and Morphology of Thin CoSi2 Films Grown on Si(100) - Effects of Growth-Parameters," Journal of Vacuum Science & Technology A-Vacuum Surfaces And Films, Vol. 7, Issue 3, pp. 1472 (1989). link
  56. Yalisove, SM; Graham, WR, "Medium-Energy Ion-Scattering Studies of Relaxation At Metal-Surfaces," Journal of Vacuum Science & Technology A-Vacuum Surfaces And Films, Vol. 6, Issue 3, pp. 588 (1988). link
  57. Yalisove, SM; Graham, WR, "Multilayer Rippled Structure of The Nial(110) Surface - a Medium Energy Ion-Scattering Study," Surface Science, Vol. 183, Issue 3, pp. 556 (1987). link
  58. Copel, M; Gustafsson, T; Graham, Wr; Yalisove, SM, "Medium-Energy Ion-Scattering Analysis of The Cu(110) Surface," Physical Review B, Vol. 33, Issue 12, pp. 8110 (1986). link
  59. Graham, WR; Yalisove, SM; Adams, Ed; Gustafsson, T; Copel, M; Tornqvist, E, "Comparison of Solid-State and Electrostatic Particle-Detection In Medium Energy Ion-Scattering With Channeling and Blocking," Nuclear Instruments & Methods In Physics Research Section B-Beam Interactions With Materials And Atoms, Vol. 16, Issue 37350, pp. 383 (1986).
  60. Yalisove, SM; Graham, Wr; Adams, Ed; Copel, M; Gustafsson, T, "Multilayer Relaxations of Ni(110) - New Medium Energy Ion-Scattering Results," Surface Science, Vol. 171, Issue 2, pp. 400 (1986). link
  61. Copel, M; Graham, Wr; Gustafsson, T; Yalisove, S, "Ion-Scattering Study of The Lithium Induced Reconstruction of Cu(110)," Solid State Communications, Vol. 54, Issue 8, pp. 695 (1985). link
  62. White, Cl; Padgett, Ra; Liu, Ct; Yalisove, SM, "Surface and Grain-Boundary Segregation In Relation To Intergranular Fracture - Boron and Sulfur In Ni3Al," Journal of Metals, Vol. 37, Issue 8, pp. A8 (1985).
  63. White, Cl; Padgett, Ra; Liu, Ct; Yalisove, SM, "Surface and Grain-Boundary Segregation In Relation To Intergranular Fracture - Boron and Sulfur In Ni3Al," Scripta Metallurgica, Vol. 18, Issue 12, pp. 1417 (1984).
  64. Gans, RF; Yalisove, SM, "Observations and Measurements of Flow In a Partially-Filled Horizontally Rotating Cylinder," Journal of Fluids Engineering-Transactions of The Asme, Vol. 104, Issue 3, pp. 363 (1982).
  65. Gans, RF; Yalisove, S, "Flow Measurements In a Partially-Filled Rotating Cylinder," Bulletin of The American Physical Society, Vol. 23, Issue 8, pp. 989 (1978).
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