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Materials Science and Engineering, University of Michigan

  MSE / People / Faculty / Xiaoqing Pan

Alumina Tube Furnace

Location: Dow 2117

Lindberg controller for heating up to 1000 deg C. Used for target sintering and thin film post-deposition anneals

Electrical Measurement Facilities

Location: DOW 2117

Designed for 2-point or 4-point Van der Pauw electrical measurements of both low and high-resistivity thin films. 2.5 kG magnet for Hall measurements. Impedance Analyzer for electrochemical characterization.

Gas Sensor Test Apparatus

Location: Dow 2117

Quartz chamber with gas inlet/outlet. Resistive heating up to 700 deg C. Four MKS Mass Flow Controllers (MFC) allow in-situ testing under different gas atmospheres and pressures.

Gatan Dimple Grinder

Location: Dow 2117

Used to dimple and polish the surface of TEM specimens before ion-milling

Gatan Precision Ion Polishing System (PIPS)

Location: Dow 2117

Precision Ion-milling of TEM plan or cross-section view specimens using (2 Ar guns)

Liquid Nitrogen Cryostat

Location: Dow 2117

Oxford Applied Research DNV Optistat for LN2 temperature optoelectronic measurements

Neocera PLD System

Location: B-112 Gerstacker

15" PLD chamber evacuated by a V-250 pump. First-stage pumping from atmosphere to 25mTorr by sorption pump. Target carousel and substrate heater by Neocera. Gauging by nude ion gauge and thermocouple gauge.

Thermionics PLD/MBE System

Location: B-112 Gerstacker

UHV-PLD system with a wire-sealed bottom flange designed for MBE. It is equipped with a load-lock chamber and magnetic transfer arm for in-vacuum transfer of targets and substrates. Adjustable target-substrate distance, radiative heating up to 1000 C. Complex substrate manipulator for precise positioning.

UV Excimer Laser

Location: B-112 Gerstacker

248 nm KrF Excimer laser, 10-50 Hz, up to 600mJ energy output, 25 ns pulsewidth.

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