Articles

1. B. L. French and J. C. Bilello, "In situ observations of the real-time stress-evolution and delamination of thin Ta films on Si(100)," Thin Solid Films, Vol. 446, pp. 91-98 (2004). link
2. M. J. Daniels, D. King, J. S. Zabinski, and J. C. Bilello, "Development of the Rhombohedral Phase in the AlCuFe Quasicrystalline System," Submitted to Journal of Materials Research, (2004).
3. M. J. Daniels, D. King, L. Fehrenbacher, J. S. Zabinski, and J. C. Bilello, "PVD Route for Production of AlCuFeCr and AlCuFe Quasicrystalline and Approximant Coatings," Submitted to Surface and Coatings Technology, (2004).
4. M. J. Daniels, J. S. Zabinski, H. Wu, C. R. M. Grovenor and J. C. Bilello, "Microstructure and Chemistry of Annealed AlCuFeCr Quasicrystalline Coatings," Submitted to Journal of Materials Research, (2004).
5. M. L. Tokarz and J. C. Bilello, "Structural Characterization of Ni-based Refractory Glassy Metals," Journal of Non-crystalline Solids, Vol. 344, pp. 110-118 (2004). link
6. M. L. Tokarz and J. C. Bilello, "On the Structural Characterization of a Series of Novel Ni-Nb-Sn Refractory Alloy Glasses," Materials Research Society Symposium Proceedings, Vol. 754, pp. MM9.5 (2004).
7. M. L. Tokarz and J. C. Bilello, "Stability of Ni-based Bulk Metallic Glasses," submitted to Trans. Met. & Mat., (2004).
8. B. L. French and J. C. Bilello, "Correlation of Stress and Phase Evolution in Thin Ta Coatings on Si (100) During Thermal Testing," Surface Engineering 2002-Synthesis, Characterization, and Applications,, Vol. Mater. Re, Issue NA, pp. NA (2003).
9. B. L. French and J. C. Bilello, , "Laue transmission diffraction optics for thin film stress calculation," Journal of Applied Physics, Vol. 94, Issue 1, pp. 224-230 (2003). link
10. M. J. Daniels, B. Phillips, D. King, J. S. Zabinski, and J. C. Bilello, " Nature of the as-deposited state of AlCuFeCr PVD coatings," Thin Solid Films, Vol. 440, pp. 87-93 (2003). link
11. M. L. Tokarz, M. J. Daniels, J. C. Bilello and Z. U. Rek, "Characterization of the Structure of a Novel Refractory Alloy Glass - Ni60Nb37Sn3," Materials Research Society Symposium Proceedings, Vol. 754, (2003).
12. Z. B. Zhao, J. Herschberger, S. M. Yalisove, and J. C. Bilello, "Determination of Residual Stress in Thin Films: A Comparative Study of X-ray Topography versus Laser Curvature Method," Thin Solid Films, Vol. 415, Issue 1-2, pp. 21-31 (2002). link
13. J. F. Whitacre, S. M. Yalisove & J. C. Bilello, "Real-time/In-situ Diffraction Study of Phase and Microstructural Evolution in Sputtered b-Ta/Ta2O3 Films," Submitted for publication J. Vac. Soc. & Tech., (2001).
14. M. J. Daniels and J. C. Bilello, "Characterization of Nanoscale Materials Structures via High Resolution Synchrotron Scattering, Nano-technology," Nano-technology, Eds. M. A. Fortes and P. J. Ferreira, IST Press, Lishon, Portugal, (2001).
15. M. J. Daniels, J. Maciejewski, J. S. Zabinski, Z. U. Rek, S. M. Yalisove, and J. C. Bilello, "An Investigation of Sputtered Al-Cu-Fe-Cr Quasicrystalline Films via Synchrotron Diffraction," Quasicrystals--Preparation; Properties and Applications as held at the 2000 MRS Fall Meeting, Boston, pp. K8.4.1-K8.4.6 (2000).
16. J. F. Whitacre, J. C. Bilello and S. M. Yalisove, "In-Plane Texturing in Films and Coatings, Textures and Microstructures,.Textures and Micro-structures," TMS, Pittsburgh, PA, Vol. 34, Issue 91, (2000).
17. L. P. Kendig, Z. U. Rek, S. M. Yalisove, J. C. Bilello, "Role of impurities and microstructure on residual stress in nanoscale Mo films," Surface and Coatings Technology (Switzerland)., Vol. 132, Issue 2-3, pp. 124-129 (2000). link